Apparatus and method for inspecting defect of mounted component

Details Apparatus and method for inspecting defect of mounted component Apparatus and method for inspecting defect of mounted component

1988-10-14

1991-12-31

Rosenberger, Richard A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356394, 356237, 382 8, G01B 1124, G06K 900

Patent

active

050766970

ABSTRACT:
Light projectors for slit lights are so arranged that at least two slit lines developed by projecting the slit lights on a chip component or the like obliquely thereto intersect each other, and the slit lines are imaged from above the component or the like by TV cameras so as to extend horizontally in the corresponding images. The shapes of the slit lines in the images are analyzed by an image processor, to detect the state change of the chip component or the like, such as the misplacement thereof. Further, if necessary, in order to enhance the contrast of the pattern of the slit line, the slit light is projected by a stroboscopic lamp within the exposure time of the TV camera, for a short time interval which is not longer than the exposure time.

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patent: 4772125 (1988-09-01), Yoshimura et al.
patent: 4978224 (1990-12-01), Kishimoto et al.
Automated Visual Inspection for Printed Circuit Board, Fujitsu Sci. Tech. J. Mar. 1988, Ando et al.

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