Apparatus and method for inspecting film defect

Details Apparatus and method for inspecting film defect Apparatus and method for inspecting film defect

2007-06-08

2008-09-23

Punnoose, Roy M (Department: 2886)

Optics: measuring and testing

By polarized light examination

Reexamination Certificate

active

07428049

ABSTRACT:
First and second polarizing plates are placed to be crossed nicols across a film to be inspected. A light source projects light toward the film through the first polarizing plate. Alight receiver receives the light transmitted through the film and the second polarizing plate. When θ1represents an angle formed between an optical axis of the light receiver and a normal line that is perpendicular to the film surface, and θ2represents a rotational angle formed between the optical axis and a reference line that is orthogonal to a slow axis of the film, the light receiver is positioned to satisfy the following conditions:15°≦θ1≦35°, 20°≦θ2≦60°.

REFERENCES:
patent: 2001/0021016 (2001-09-01), Shimoda
patent: 6-235624 (1994-08-01), None
patent: 8-54351 (1996-02-01), None
patent: 9-73081 (1997-03-01), None
patent: 11-30591 (1999-02-01), None
patent: 2001-324453 (2001-11-01), None

Affiliated with

Also associated with

Rating

Apparatus and method for inspecting film defect does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and method for inspecting film defect, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for inspecting film defect will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3979872