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System for inspecting the surfaces of objects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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System for locating breaks in fiber optic filaments

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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System for measuring angular deviation in a transparency

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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System for monitoring foreign particles, process processing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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System for monitoring foreign particles, process processing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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System for optically examining plastic card surfaces

Optics: measuring and testing – Inspection of flaws or impurities
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System for processing electronic devices

Optics: measuring and testing – Inspection of flaws or impurities
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System for repairing damaged gas turbine engine airfoils

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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System for the detection of macrodefects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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System of detecting optical distortion of a light-transmitting p

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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System, method and apparatus for in-situ substrate inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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System, method and apparatus for in-situ substrate inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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System, method and apparatus for in-situ substrate inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Systems and methods for a wafer inspection system using...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Systems and methods for a wafer inspection system using...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Systems and methods for acquiring information about a defect...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Systems and methods for detecting defects in ceramic filter...

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
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Systems and methods for determining a characteristic of a...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Systems and methods for determining the shape of glass sheets

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
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Systems and methods for forming an image of a specimen at an...

Optics: measuring and testing – Inspection of flaws or impurities
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