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Unit for inspecting a surface

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Use of fiducial marks for improved blank wafer defect review

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Use of laser reflection pickup unit for detection of small...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Using a laser beam to indicate roller wear

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Using scatterometry for etch end points for dual damascene...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Using special visibility materials proximate candidate...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

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UV compatible programmable spatial filter

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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