Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1981-03-11
1983-03-22
Corbin, John K.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
356371, G01N 2188
Patent
active
043773419
ABSTRACT:
An improved system for measuring absolute angular deviation through transparencies, such as aircraft windscreens, uses an incoherent light source and a target configuration in the form of an opaque slide with a transparent "L"-shaped pattern. The positions of images of the legs of the "L" passed through the transparency are detected by CCD arrays for measurement of the azimuth and elevation components of angular deviation for each tested point on the transparency, uncontaminated by lateral displacement errors.
REFERENCES:
patent: 3578869 (1971-05-01), Irland et al.
patent: 3688235 (1972-08-01), Migeotte
patent: 4249823 (1981-02-01), Task
patent: 4255055 (1981-03-01), Schave
patent: 4310242 (1982-01-01), Genco et al.
Dabbs Albert G.
Genco Louis V.
Smith Kenneth L.
Task Harry L.
Corbin John K.
Flanagan John R.
Koren Matthew W.
Singer Donald J.
The United States of America as represented by the Secretary of
LandOfFree
System for measuring angular deviation in a transparency does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for measuring angular deviation in a transparency, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for measuring angular deviation in a transparency will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1867425