Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2009-03-02
2011-10-25
Punnoose, Roy M (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
Reexamination Certificate
active
08045148
ABSTRACT:
A system for monitoring foreign matter includes a manufacturing line having plural process processing apparatuses, a production management system which manages the processing of workpieces in the manufacturing line, plural optical heads which monitor foreign matter in relation to at least one of the workpieces, and which provide an output signal indicative thereof, and at least one image signal processing unit provided in a lesser number than a number of the plural optical heads for processing the output signal therefrom.
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Nishiyama Hidetoshi
Noguchi Minori
Sekiguchi Takuaki
Watanabe Tetsuya
Antonelli, Terry Stout & Kraus, LLP.
Hitachi High-Technologies Corporation
Punnoose Roy M
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