System for processing electronic devices

Details System for processing electronic devices System for processing electronic devices

2007-03-13

2007-03-13

Stafira, Michael P. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

C356S237200

Reexamination Certificate

active

10741862

ABSTRACT:
A system is provided for processing electronic devices, and in particular for handling, inspecting, sorting and offloading the same. An apparatus for inspecting an electronic device comprises a holder for supporting the electronic device and a driving mechanism for moving the electronic device between an onloading position where the electronic device is placed onto the holder and an offloading position where the electronic device is removed from the holder. A first optical system between the onloading and offloading positions is configured to inspect a first surface of the electronic device while it is supported by the holder, Concurrently or subsequently, a second optical system between the onloading and offloading positions is configured to inspect a second surface of the electronic device that is opposite to the first surface while it is supported by the holder.

REFERENCES:
patent: 5940175 (1999-08-01), Sun
patent: 6062084 (2000-05-01), Chang et al.
patent: 6614519 (2003-09-01), Latta et al.
patent: 6813016 (2004-11-01), Quist

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