LandOfFree - US Patents - Listing for Optics: measuring and testing,Inspection of flaws or impurities,Having predetermined light transmission regions

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Surface inspecting device using bisected multi-mode laser beam a

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection apparatus for objects

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection lighting apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection scanning system

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection system

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection system and method of inspecting surface of wo

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection system with misregistration error correction

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface inspection using retro-reflective light field

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface profile analyzer

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface scanner with thin film gauge

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface scanning apparatus and method using crossed-cylinder opt

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface state inspection apparatus and exposure apparatus includ

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface-condition inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface-condition inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Surface-condition inspection method and apparatus including a pl

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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System and method for detecting defects in an interlayer dielect

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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System and method for detecting particles on substrate-supportin

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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System for checking defects on a flat surface of an object

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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