Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1979-10-22
1981-11-17
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
250202, 356377, G01B 1124
Patent
active
043008364
ABSTRACT:
A scanner profiling system for locating and "mapping" a selected "feature" in a three-dimensional object, which "feature" is nearest with respect to a defined datum plane. The system includes a laser-distancing-instrument (LDI), and a cooperating motor-driven mirror apparatus which is operated under digital computer control to shift the scan axis of the system, in preselected steps, throughout a defined scan field. Object "feature" location, and related scan orientation data which are obtained during a scanning operation, effect computer scan control, whereby scanning "attention", within the total scan field, is directed particularly to "track" the selected "feature".
REFERENCES:
patent: 3050581 (1962-08-01), Bomba et al.
patent: 3724923 (1973-04-01), Fischer
patent: 3757125 (1973-09-01), Okada et al.
patent: 3806253 (1974-04-01), Denton
patent: 3852579 (1974-12-01), Sohn
patent: 4209252 (1980-06-01), Arditty et al.
Holmes Jones F.
Jacob Ralph L.
Oregon Graduate Center for Study and Research
Punter William H.
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