Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1981-06-02
1986-03-18
Reeves, Robert B.
Optics: measuring and testing
By polarized light examination
With light attenuation
356384, 356426, 358107, 382 67, 209538, 209586, G01B 1124
Patent
active
045764824
ABSTRACT:
A method and apparatus for inspecting workpieces for rapid and accurate determination of dimensions and the like. The equipment is electro-optical in nature and there is no contact between the inspecting elements and the workpiece under inspection. An electro-optical sensor is utilized which includes a light source for illuminating at least one edge of a workpiece, a lens for forming an image of the illuminated edge, and an array of photosensitive elements, such as photodiodes, capable of producing an electrical signal in response to light incident thereon. The light, including the edge image, is impinged upon the array and the electrical signals produced correspond to the portion of the edge, its shape, etc. The signals can be rapidly analyzed to provide a determination of a dimension such as length, squareness, curvature, and the like.
REFERENCES:
patent: 1640567 (1927-08-01), Firestone
patent: 2415176 (1947-02-01), Hurley, Jr.
patent: 2531317 (1950-11-01), Baney et al.
patent: 2970691 (1961-02-01), Ungerer
patent: 3462015 (1969-08-01), Tysver et al.
patent: 3604940 (1971-09-01), Matthews
patent: 3662341 (1972-05-01), Baumgartner et al.
patent: 3666885 (1972-05-01), Hemsley et al.
patent: 3743428 (1973-07-01), Brown
patent: 3749500 (1973-07-01), Carlson et al.
patent: 3830401 (1974-08-01), Benwood et al.
patent: 3852579 (1974-12-01), Sohn et al.
patent: 3901606 (1975-08-01), Watanabe et al.
patent: 3918049 (1975-11-01), Snyder et al.
patent: 3918586 (1975-11-01), Tyler et al.
patent: 3935562 (1976-01-01), Stephens
patent: 3947129 (1976-03-01), Wiklund
patent: 4105925 (1978-08-01), Rossol et al.
patent: 4117539 (1978-09-01), Bell et al.
patent: 4122525 (1978-10-01), Eaton
patent: 4152767 (1979-05-01), Laliotis
patent: 4192613 (1980-03-01), Hammar
patent: 4240107 (1980-12-01), Yoshida
Diffracto Ltd.
Reeves Robert B.
Wacyra Edward M.
LandOfFree
Electro-optical inspection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electro-optical inspection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electro-optical inspection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2302888