Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-11-25
1999-11-23
Kim, Robert H.
Optics: measuring and testing
By polarized light examination
With light attenuation
3562375, 228105, G01B 1114, G01N 2155, B23K 3112
Patent
active
059910399
ABSTRACT:
An electronic component monitoring device and method for correctly recognizing electronic components with bumps. A reflection-recognizing light emitter for emitting light toward an array of bumps on an electronic component, a transmission-recognizing light emitter for emitting light toward a background board, and a bump-recognizing light emitter for emitting light at an acute angle toward the array face of the electronic component are provided, and switchable light emitter(s) is/are switched on and off in accordance with a bump recognition method, transmission recognition method, and reflection recognition method.
REFERENCES:
patent: 4677473 (1987-06-01), Okamoto et al.
patent: 5601229 (1997-02-01), Nakazato et al.
Fujishiro Keisuke
Goto Minehiko
Murata Hiroshi
Takata Koji
Kim Robert H.
Matsushita Electronic Industrial Co. Ltd.
Smith Zandra V.
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