Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-01-24
1995-05-30
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
29721, 29759, 348 87, G01B 1100
Patent
active
054206910
ABSTRACT:
An electronic component observation system includes a transparent stage for supporting thereon an electronic component which is being held by a vacuum nozzle of a transfer head, a lighting unit for illuminating outer leads of the electronic component from the above, and a camera for observing the outer leads from the underside of the transparent stage. When the electronic component being held by the vacuum nozzle is placed on the state, a deformation the outer leads is rectified. The lighting unit may include a presser portion engageable with the outer leads to force the outer leads against the stage, thereby positively shaping the outer leads into a correct form.
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Matsushita Electric - Industrial Co., Ltd.
Pham Hoa Q.
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