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Surface structure measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Surface topography measurement apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Surface undulation inspection apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
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Surgical microscope for conducting computer-supported stereotact

Optics: measuring and testing – By polarized light examination – With light attenuation
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Surgical microscope for conducting computer-supported stereotact

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Synchronous optical scanning apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and method for image acquisition for inspection of articl

Optics: measuring and testing – By polarized light examination – With light attenuation
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System and method for measuring the microroughness of a surface

Optics: measuring and testing – By polarized light examination – With light attenuation
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System and method for measuring the microroughness of a surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and method for three-dimensional inspection using pattern

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and method for three-dimensional inspection using...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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System and process for controlled removal of material to produce

Optics: measuring and testing – By polarized light examination – With light attenuation
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System and process for detecting and monitoring surface defects

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for 3-D inspection of objects

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for automatically inspecting a flat workpiece for holes

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for detecting and locating surface discontinuity by a lig

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for detecting the position of observation spot

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for detecting the presence and location of at least one o

Optics: measuring and testing – By polarized light examination – With light attenuation
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System for detecting the presence of deposited metals on solderi

Optics: measuring and testing – By polarized light examination – With light attenuation
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System for detecting unevenness degree of surface of semiconduct

Optics: measuring and testing – By polarized light examination – With light attenuation
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