Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1990-06-07
1992-06-30
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356371, 2502013, 358107, G01B 1124
Patent
active
051257467
ABSTRACT:
This patent describes a mechano-optical non-contact system, and method of use, for characterizing the topography of an area of a surface. The instrumentation consists of an optical system that illuminates a small region of the surface with a focused wedge of light at fixed angle, a magnification system to view the diffuse reflected profile image, a video camera that provides electrical signals corresponding to the profile image, a three dimensional, computer controlled motorized stage, a means for automatically focusing each region of the surface with respect to the optical system, and a computer to analyze and operate on the signal, and record the primary topographical data. The primary data obtained, from which all other parameters derive, are the heights, over an area, as a function of their x,y coordinates in a reference plane (i.e. z(x,y)). The system automatically measures the coordinates of points on the surface, at equally spaced intervals, along profiles that can be many times the optical field. Coordinate data for an area are obtained by measuring the coordinates along close and equally spaced profiles within the region.
REFERENCES:
patent: 4629324 (1986-12-01), Stern
patent: 4743771 (1988-05-01), Sacks et al.
patent: 4844617 (1989-07-01), Kelderman et al.
patent: 4931630 (1990-06-01), Cohen et al.
patent: 4971445 (1990-11-01), Sato et al.
Brandt John M.
Evans F. L.
LandOfFree
Surface topography measurement apparatus and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Surface topography measurement apparatus and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Surface topography measurement apparatus and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1859325