Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1998-09-24
2000-07-11
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356394, 3562371, G01B 1100
Patent
active
060881097
ABSTRACT:
A system for detecting deposited metals on soldering points of an integrated circuit board substrate, a light source, a charge coupled device camera, and a computer. The camera captures an image of the substrate of a ball grid array integrated circuit board and converts the image into a digital image signal. The dot matrix image is transmitted to the computer for analysis by software to examine a conformity index between the image on the substrate to be detected and the image of a reference substrate, thereby providing an automatic detecting function.
REFERENCES:
patent: 5166985 (1992-11-01), Takagi et al.
patent: 5245671 (1993-09-01), Kobayashi et al.
patent: 5296945 (1994-03-01), Nishikawa et al.
patent: 5343386 (1994-08-01), Barber
patent: 5450204 (1995-09-01), Shigeyama et al.
patent: 5686994 (1997-11-01), Tokura
patent: 5760893 (1998-06-01), Raymond
patent: 5774224 (1998-06-01), Kerstens
patent: 5903353 (1999-05-01), Raymond
David W. Capson and Sai-Kit Eng, "A Tiered-Color Illumination Approach for Machine Inspection of Solder Joints", IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 10, No. 3, May 1988, pp388-391, May 1988.
Advanced Semiconductor Engineering Inc.
Font Frank G.
Punnoose Roy M.
LandOfFree
System for detecting the presence of deposited metals on solderi does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System for detecting the presence of deposited metals on solderi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for detecting the presence of deposited metals on solderi will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-547425