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System for determination of a location in three dimensional spac

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for in-line monitoring of photo processing in VLSI fabric

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for locating a body in motion

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for locating relative positions of objects in three dimen

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for maintaining the cutting condition of double ground kn

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring and detecting printed circuit wiring defect

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring gap and mismatch between opposing parts

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring irregularities of road surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring surface flatness using shadow moire technol

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring the position of a moving body

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for optically measuring the surface contour of a part usi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for point-by-point measuring of spatial coordinates

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for point-by-point measuring of spatial coordinates

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for positioning a body

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for remotely reading an analog meter

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for three-dimensional measurement of inaccessible hollow

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System to protect optics against dirty environments

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Systems and methods for calibrating laser ablations

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Systems and methods for limiting power using photo-induced...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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