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Surface condition measurement apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection
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Surface inspection apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection
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Surface inspection apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection
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Surface particle detection using heterodyne interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
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Surface profile and material mapper using a driver to displace t

Optics: measuring and testing – By particle light scattering – With photocell detection
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Surface profile measuring device utilizing optical heterodyne in

Optics: measuring and testing – By particle light scattering – With photocell detection
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Surface roughness measuring apparatus utilizing deflectable lase

Optics: measuring and testing – By particle light scattering – With photocell detection
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Surface shape measurement apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection
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Suspended particle concentration monitor

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Symmetric Mach-Zehnder all-optical device

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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System and method for accurate loop length determination in fibe

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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System and method for characterizing three-dimensional...

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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System and method for detecting and analyzing particles...

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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System and method for detecting particles produced in a process

Optics: measuring and testing – By particle light scattering
Patent

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System and method for detecting the angle of a light beam using

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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System and method for interferometric measurement of aspheric su

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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System and method for measuring birefringence in an optical...

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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System and method for measuring particles in a sample stream...

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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System and method for minimizing input polarization-induced phas

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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System and method for multiple laser triggering

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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