System and method for measuring birefringence in an optical...

Optics: measuring and testing – By particle light scattering – With photocell detection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S365000, C356S368000, C356S369000, C250S201300, C359S322000, C359S245000

Reexamination Certificate

active

06947137

ABSTRACT:
A system and method are described herein for determining the quality of an optical material by measuring and analyzing birefringence (e.g., stress-induced birefringence, inherent birefringence) in the optical material (e.g., glass sheet). The method is a scanning technique in which a birefringence sensor is set to a first optical state and then moved in a direction at a constant velocity over a glass sheet while first power transmission measurements are made at a high data rate. At the end of this move, the birefringence sensor is set to a second optical state and then moved at the same velocity back over the glass sheet, while second power transmission measurements are made. This procedure is repeated the same number of times as there are optical states in the birefringence sensor. A computer then calculates birefringence values using profiles of the power transmission measurements so as to determine the quality of the glass sheet.

REFERENCES:
patent: 4529310 (1985-07-01), Matsuda et al.
patent: 4914487 (1990-04-01), Croizer et al.
patent: 5243455 (1993-09-01), Johnson et al.
patent: 5504581 (1996-04-01), Nagata et al.
patent: 5521705 (1996-05-01), Oldenbourg et al.
patent: 5949480 (1999-09-01), Gerhart et al.
patent: 6134009 (2000-10-01), Zavislan
patent: 6134010 (2000-10-01), Zavislan
patent: 6266141 (2001-07-01), Morita
patent: 6353494 (2002-03-01), Hamada
R. Oldenbourg et al., “New polarized light microscope with precision universal compensator”, Journal of Microscopy, vol. 180, Pt. 2, Nov. 1995, p. 140-147.
B. Wang et al., “A new instrument for measuring both the magnitude and angle of low level linear birefringence”, Review of Scientific Instruments, vol. 70, No. 10, Oct. 1999, pp. 3847-3854.
R. Oldenbourg, “A new view on polarization microscopy”, Nature, vol. 381, Jun. 27, 1996, pp. 811-812.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for measuring birefringence in an optical... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for measuring birefringence in an optical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for measuring birefringence in an optical... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3401607

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.