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Economical spectrometer unit having simplified structure

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Electro-optic reflection device with traveling-wave structure

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Electro-optical measuring device for absolute distances

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Electromagnetic radiation detector utilizing an electromagnetic

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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ELSD diffuser

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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ELSD diffuser

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Emission source spectrum stabilizer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Emission spectral width measuring apparatus for light source

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Enhanced detection system and method

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Environmental sensor including a baffle

Optics: measuring and testing – By particle light scattering
Reexamination Certificate

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Evaporative light scattering detector

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Evaporative light scattering device

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Evaporative light scattering device and methods of use thereof

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Extended distance range optical low-coherence reflectometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Extended-range two-color interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Eye measurement of optical signals by optical sampling

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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