Determination of thin film topography

Determining an optical property by using superimposed...

Determining and compensating for modulator dynamics in...

Determining electric field characteristics of laser pulses

Determining endpoint in a substrate process

Determining endpoint in a substrate process

Determining optical characteristics of optical devices under...

Determining positional error of an optical component using...

Determining thickness of slabs of materials by inventors

Device and method for a combined interferometry and...

Device and method for optical path length measurement

Device and method for spectrally resolving detection of a...

Device and method for the determination of imaging errors...

Device and method for the interferometric measurement of...

Device and method for the optical measurement of an optical...

Device and method for the optical measurement of an optical...

Device and method for wavefront measurement of an optical...

Device and method for wavefront measurement of an optical...

Device and process for extinguishing a source

Device for acquiring mechanical variables by evaluating the...