LandOfFree - US Patents - Listing for Optics: measuring and testing,By light interference

Selected: S

All A B C D E F G H I J K L M N O P Q R

T U V W X Y Z 0 1 2 3 4 5 6 7 8 9 ! " $ ' ( ) * , - / : < = > ? @ [ \ ] ^ ` { | } ~ €

Sagnac fourier transform spectrometer having improved...

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Sagnac fourier transform spectrometer having improved...

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Sagnac interferometer current sensor

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Sagnac sensor with nested waveguides

Optics: measuring and testing – By light interference – Rotation rate

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Sample inclination measuring method

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Sampling spectrophotometer comprising an interferometer

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scale reading apparatus

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scan error correction in low coherence scanning interferometry

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning double-beam interferometer

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning exposure method and apparatus, and device...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometric methods and apparatus for measuring...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometric near-field confocal microscopy

Optics: measuring and testing – By light interference

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometric near-field confocal microscopy with...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometry

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometry for thin film thickness and surface...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Scanning interferometry for thin film thickness and surface...

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

Charities
Companies
MP Candidates
Patents
Employee Salary Disclosure

World

Places of the World
Scientific Papers

United States

Banks
Companies
Counties
Patents
Employee Salary Disclosure