Determining optical characteristics of optical devices under...

Details Determining optical characteristics of optical devices under... Determining optical characteristics of optical devices under...

2005-09-13

2005-09-13

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

Using fiber or waveguide interferometer

Reexamination Certificate

active

06943891

ABSTRACT:
Systems, methods, computer-readable media for determining optical characteristics, such as polarization mode dispersion and/or polarization dependent loss, of device under test (DUTs) are provided. In this regard, one such system includes a response analyzer that receives data corresponding to responses of a DUT to optical signals. The response analyzer computes fast and slow group delays corresponding to at least some of the optical signals, each of the fast and slow group delays being attributable to one of a first and a second principle state of polarization. The response analyzer then assigns each of the fast and slow group delays to a correct one of the first and second principle states of polarization for at least some of the optical signals.

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Schmidt, Siegmar and Hentschel, Christian, “PDL Measurements Using the HP 8169A Polarization Controller,” Hew lett-Packard Company 1996, 1997.

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