Optics: measuring and testing – By light interference – Holography
Reexamination Certificate
2007-05-17
2010-10-19
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
Holography
C356S485000
Reexamination Certificate
active
07817283
ABSTRACT:
Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating. The spectral filter is angularly offset about a vertical transverse angle associated with the optical system. The diffraction grating is angularly offset about the optical axis relative to the spectral filter, and an optical capture device positioned after the spectral filter.
REFERENCES:
patent: 3633986 (1972-01-01), Broussaud et al.
patent: 5132811 (1992-07-01), Iwaki et al.
patent: 7298489 (2007-11-01), Dorrer
patent: 2006/0088259 (2006-04-01), Weiner
patent: 2008/0285031 (2008-11-01), Bowlan et al.
Gabolde et al. “Self-referenced measurement of the complete electric field of ultrashort pulses”, Sep. 20, 2004, Optics Express vol. 12, No. 19. pp. 4423-4429.
W. Amir, T.A. Planchon, C.G. Durfee, J.A. Squier, P. Gabolde, R. Trebino and M. Muller, “Simultaneous Visualization of Spatial and Chromatic Aberrations by Two-Dimensional Fourier Transform Spectral Interferometry”, vol. 31, No. 19/Optics Letters; Mar. 27, 2006, pp. 2927-2929.
A.P. Kovacs, K. Osvay, ZS. Bor and R. Szipocs, “Group-Delay Measurement on Laser Mirrors by Spectrally Resolved White-Light Interferometry”, Optics Letters/vol. 20, No. 7,Oct. 6, 1994, pp. 788-790.
Zoltan L. Horvath, Zsolt Bor, “Focusing of Truncated Gaussian Beams”, Optics Communications 222, pp. 51-68, www.sciencedirect.com; Sep. 23, 2002, pp. 51-68.
A.P. Kovacs, K. Osvay, G. Kurdi, M. Gorbe, J. Klebniczki and Z. Bor, “Dispersion Control of Pulse Stretcher-Compressor System with Two-Dimensional Spectral Interferometry”, Oct. 18, 2004, Springer-Verlang 2004, Appl. Phys. B80, pp. 165-170.
CL. Froehly, A. Lacourt, et J. CH. Vienot, “Notions de Reponse Impulsionnelle et de Fonction de Transfert Temporelles des Pupilles Optiques, Justifications Experimentales et Applications”, Nouv. Rev. Optique, 1973, t. 4, No. 4, pp. 183-196.
Eric Cormier, Ian A. Walmsley, Ellen M. Kosik, Adam S. Wyatt, Laura Corner and Louis F. Dimauro, “Self-Referencing, Spectrally, or Spatially Encoded Spectral Interferometry for the Complete Characterization of Attosecond Eletromagnetic Pulses”, Physical Review Letters, Jun. 9, 2004, The American Physical Society, pp. 33905-1-33905-4.
David N. Fittinghoff, Jason L. Bowie, John N. Sweetser, Richard T. Jennings, Marco A. Krumbugel, Kenneth W. Delong, Rick Trebino and Ian A. Walmsley, “Measurement of the Intensity and Phase of Ultraweak, Ultrashort Laser Pulses”, Optics Letters/vol. 31, No. 12, Jan. 11, 1996, pp. 884-886.
J.P. Geindre, P. Audebert, S. Rebibo, and J.C. Gauthier, “Single-Shot Spectral Interferometry with Chirped Pulses”, Optics Letters/vol. 26, No. 20, Jan. 3, 2001, pp. 1612-1614.
J.P. Geindre, P. Audebert, A. Rousse, F. Fallies, J.C. Gauthier, A. Mysyrowicz, A. Dos Santos, G. Hamoniaux, and A. Antonetti, “Frequency-Domain Interferometer for Measuring the Phase and Amplitude of a Femtosecond Pulse Probing a Laser-Produced Plasma”, Optics Letters/vol. 19, No. 23, Jun. 8, 1994, pp. 1997-1999.
J. Jasapara and W. Rudolph, “Characterization of Sub-10-fs Pulse Focusing with High-Numerical-Aperture Microscope Objectives”, Optics Letters/vol. 24, No. 11, Jan. 4, 1999, pp. 777-779.
L. Lepetit, G. Cheriaux, and M. Joffre, “Linear Techniques of Phase Measurement by Femtosecond Spectral Interferometry for Applications in Spectroscopy”, J. Opt. Soc. Am. B/vol. 12, No. 12, Mar. 29, 1995, pp. 2467-2474.
D. Meshulach, D. Yelin, and Y. Silberberg, “Real-Time Spatial-Spectral Interference Measurements of Ultrashort Optical Pulses”, J. Opt. Soc. Am. B/vol. 14, No. 8, Jan. 31, 1997, pp. 2095-2098.
Robert J. Levis, Getahun M. Menkir, Herschel Rabitz, “Selective Bond Dissociation and Rearrangement with Optimally Tailored, Strong-Field Laser Pulses” Science/vol. 292, pp. 709-713, Apr. 27, 2001, pp. 709-713.
Daniel J. Kane and Rick Trebino, “Characterization of Arbitrary Femtosecond Pulses Using Frequency-Resolved Optical Gating”, IEEE Journal of Quantum Electronics/vol. 29, No. 2, Feb. 1993, pp. 571-579.
Dan Oron and Yaron Silberberg, “Spatiotemporal Coherent Control Using Shaped, Temporally Focused Pulses”, Optics Express/vol. 13, No. 24, Oct. 31, 2005, pp. 9903-9908.
Chris Iaconis and Ian A. Walmsley, “Self-Referencing Spectral Interferometry for Measuring Ultrashort Optical Pulses”, IEEE Journal of Quantum Electronics/vol. 35, No. 4, Apr. 1999, pp. 501-509.
M. Kempe and W. Rudolph, “Femtosecond Pulses in the Focal Region of Lenses”, The American Physical Society/vol. 48, No. 6, Apr. 15, 1993, pp. 4721-4729.
M. Kempe and W. Rudolph, “Impact of Chromatic and Spherical Aberration on the Focusing of Ultrashort Light Pulses by Lenses”, Optics Letters/vol. 18, No. 2, Aug. 17, 1992, pp. 137-139.
M. Mueller, J. Squier, and G.J. Brakenhoff, Measurement of Femtosecond Pulses in the Focal Point of a High-Numerical-Aperture Lens by Two-Photon Absorption, Optics Letters/vol. 20, No. 9, Sep. 12, 1994, pp. 1038-1040.
M. Kempe, U. Stamm, B. Wilhelmi and W. Rudolph, “Spatial and Temporal Transformation of Femtosecond Laser Pulses by Lenses and Lens Systems”, J. Opt. Soc. Am. B/vol. 9, No. 7, Jan. 21, 1992, pp. 1158-1165.
Vadim V. Lozovoy, Igor Pastirk, and Marcos Dantus, “Multiphoton Intrapulse Interference. IV. Ultrashort Laser Pulse Spectral Phase Characterization and Compensation”, Optics Letters/vol. 29, No. 7, Aug. 4, 2003, pp. 775-777.
Jonathan R. Birge, Richard Ell, and Franz X. Kartner, Two-Dimensional Spectral Shearing Interferometry for Few-Cycle Pulse Characterization, Optics Letters/vol. 31, No. 13, Mar. 7, 2006, pp. 2063-2065.
Zsolt Bor, Zoltan Gogolak and Gabor Szabo, “Femtosecond-Resolution Pulse-Front Distortion Measurement by Time-of-Flight Interferometry” Optics Letters/vol. 14, No. 16, Feb. 13, 1989, pp. 862-864.
Rebecca Chadwick, Erik Spahr, Jeff A. Squier, Charles G. Durfee, Barry C. Walker, and David N. Fittinghoff, Fringe-Free, Background-Free, Collinear Third-Harmonic Generation Frequency-Resolved Optical Gating Measurements for Multiphoton Microscopy, Optics Letters/vol. 31, No. 22, Jul. 10, 2006, pp. 3366-3368.
David N. Fittinghoff, Jeff A. Squier, C.P.J. Barty, John N. Sweetser, Rick Trebino, and Michiel Muller, “Collinear Type II Second-Harmonic-Generation Frequency-Resolved Optical Gating for Use with High-Numerical-Aperature Objectives”, Optics Letters/vol. 23, No. 13, Mar. 19, 1998, pp. 1046-1048.
Ulrike Fuchs, Uwe D. Zeitner and Andreas Tunnermann, “Ultra-Short Pulse Propagation in Complex Optical Systems”, Optics Express/vol. 13, No. 10, Mar. 17, 2005, pp. 3852-3861.
Andrei B. Vakhtin, Kristin A. Peterson, William R. Wood, and Daniel J. Kane,“Differential Spectral Interferometry: An Imaging Technique for Biomedical Applications”, Optics Letters/vol. 28, No. 15, Feb. 24, 2003, pp. 1332-1334.
Nirit Dudovich, Dan Oron and Yaron Silberberg,“Single-Pulse Coherently Controlled Nonlinear Raman Spectroscopy and Microscopy”, Nature/vol. 418, Aug. 2002, pp. 512-514.
Pamela Bowlan, Pablo Gabolde, Aparna Shreenath, Kristan Marshall, Selcuk Akturk, and Rick Trebino, Cross-Beam Spectral Interferometry: A Simple, High-Spectral-Resolution method for Completely Characterizing Complex Ultrashort Pulses in Real Time, Optics Express, vol. 14, No. 24, Nov. 27, 2006, pp. 11892-11900.
J.P. Geindre, P. Audebert, A. Rousse, F. Fallies, J.C. Gauthier, A. Mysyrowicz, A.Dos Santos, G. Hamoniaux, and A. Antonetti, “Frequency-domain interferometer for measuring the phase and amplitude of a femtosecond pulse probing a laser-produced plasma,
Gabolde Pablo
Trebino Rick
Connolly Patrick J
Georgia Tech Research Corporation
Thomas Kayden Horstemeyer & Risley LLP
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