Determining electric field characteristics of laser pulses

Optics: measuring and testing – By light interference – Holography

Reexamination Certificate

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C356S485000

Reexamination Certificate

active

07817283

ABSTRACT:
Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating. The spectral filter is angularly offset about a vertical transverse angle associated with the optical system. The diffraction grating is angularly offset about the optical axis relative to the spectral filter, and an optical capture device positioned after the spectral filter.

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