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Optical position indicator

Optics: measuring and testing – By light interference – For dimensional measurement
Patent

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Optical position measuring arrangement

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Optical position measuring device with a beam splitter

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Optical position measuring system and method using a low...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical position measuring system employing a scale with...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical position measuring system using an interference pattern

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical position-measuring device

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Optical probe for use with a digital camera for measuring...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical profile determining apparatus and associated methods...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical recording and/or reproduction apparatus, tracking...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical surface profiling systems

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical system alignment system and method with high...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical system and optical apparatus capable of switching...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Optical system for measuring diameter, distribution and so...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical system for oblique incidence interferometer and...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical system for oblique incidence interferometer and...

Optics: measuring and testing – By light interference – For dimensional measurement
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Optical system in exposure apparatus, and device...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Optical system of a microlithographic projection exposure...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Optical system of a microlithographic projection exposure...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Optical system of a microlithographic projection exposure...

Optics: measuring and testing – By light interference – For dimensional measurement
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