Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2007-05-29
2007-05-29
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S521000
Reexamination Certificate
active
10938954
ABSTRACT:
A system for aligning of optical components includes an interferometer and a first diffractive alignment element. A housing is used for positioning a first optical element being aligned. A detector is used for detecting fringes produced by reflections off surfaces of the first optical element. A grating pattern on the first diffractive alignment element is designed to produce a retro-reflected wavefront or a wavefront transmitted or reflected in a predetermined direction when the first optical element is in alignment. The first diffractive alignment element includes a first region for alignment of the interferometer, a second region for alignment of one surface of the first optical element, and a third region for alignment of another surface of the first optical element. The first, second and third regions can be of any shape such as circular, rectangular, triangular, or the like.
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Harned Nora-Jean
Harned Robert D.
ASML Holding N.V.
Lee Hwa (Andrew)
Sterne Kessler Goldstein & Fox P.L.L.C.
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