LandOfFree - US Patents - Listing for Optics: measuring and testing,By configuration comparison

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Device for measuring ink film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Device for measuring the thickness of thin films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Device for measuring the transverse dimension of a thread

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Device for monitoring characteristics of a film on a substrate

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Device for optical measurement of width/thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Device/process for contact free distance and thickness measureme

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Dichotomous scan system for detection of edges of objects and ov

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Dichotomous scan system for detection of edges of objects and ov

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Digital range sensor system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Dimension measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Dimension measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Dimension-measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Dimensioning system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Reexamination Certificate

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Dimensioning system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Dimensioning system

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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Distance measurement device

Optics: measuring and testing – By configuration comparison – With two images of single article compared

Patent

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Drill diameter measuring machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

Patent

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