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System and method for automated positioning of camera

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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System and method for facilitating wafer alignment by...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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System for compensating antenna membrane deflection

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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System for leveling workpieces

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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System for scanning color printing register marks printed on the

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Transfer apparatus for compensating for a transfer error

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Video positioning system for a pouring vessel

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Visual sensor coordinate system setting jig and setting method

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer alignment device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer alignment sensor using a phase-shifted microlens array

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Wafer inspecting apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer notch dimension measuring apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer pre-alignment apparatus and method

Optics: measuring and testing – By alignment in lateral direction – With light detector
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