LandOfFree - US Patents - Listing for Measuring and testing

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever and process for fabricating it

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element

Cantilever beam G-switch

Measuring and testing – Volume or rate of flow – By measuring vibrations or acoustic energy

Cantilever beam, insertable, vortex meter sensor

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever chip for use in scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever deflection sensor and use thereof

Measuring and testing – Moisture content or absorption characteristic of material

Cantilever driver bar

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for a scanning probe microscope and a method of manuf

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for atomic force microscope and method of manufacturi

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for atomic force microscope and method of manufacturi

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for scanning probe microscopy

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for use in a scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for use in atomic force microscope and manufacturing

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for use with atomic force microscope and process for

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for use with atomic force microscope and process for

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for vertical scanning microscope and probe for...

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever having sensor system for independent measurement...

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever probe and scanning type probe microscope utilizing th

Measuring and testing – Volume or rate of flow – Thermal type

Cantilever semiconductor device