LandOfFree - US Patents - Listing for Measuring and testing

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope and driving method therefor

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope and method of analyzing frictions in ato

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope employing beam tracking

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope employing beam-tracking

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope for biological specimens

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope for small samples having dual-mode opera

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope having cantilever with piezoresistive de

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope system with cantilever having unbiased s

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope system with multi-directional voice coil

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope under high speed feedback control

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic force microscope using a torsional harmonic cantilever