Atomic force gradient microscope and method of using this...

Details Atomic force gradient microscope and method of using this... Atomic force gradient microscope and method of using this...

2011-06-14

2011-06-14

Williams, Hezron (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

C116S275000

Reexamination Certificate

active

07958776

ABSTRACT:
A scanning probe microscope in which the probe is oscillated at a frequency lower than its resonant frequency, a force sensor that is sensitive to the bending of the cantilever and minimally sensitive to the oscillation is used to measure tip-sample interaction force. The sensor signal is then converted to a force gradient signal by electronics. The gradient signal is kept constant by a feedback mechanism as the tip is scanned across the surface of a sample, and force and topographical information are mapped.

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