Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2007-10-23
2008-07-29
Larkin, Daniel S (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07404314
ABSTRACT:
An atomic force microscope based apparatus for examining a sample includes a cantilever having a cantilever arm and a probe tip where the probe tip is offset laterally from a longitudinal axis of torsion of the cantilever arm, an oscillator that drives the cantilever into oscillation in a flexural mode to cause the probe tip to repeatedly interact with the sample where the tip-sample interaction of the laterally offset probe tip excites torsional motion of the cantilever, and a detection system that detects torsional motion of the cantilever in response to the tip-sample interaction.
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Quate Calvin F.
Sahin Ozgur
Solgaard Olav
Cook Carmen C.
Larkin Daniel S
Patent Law Group LLP
The Board of Trustees of the Leland Stanford Junior University
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