Atomic force microscope and method of analyzing frictions in ato

Details Atomic force microscope and method of analyzing frictions in ato Atomic force microscope and method of analyzing frictions in ato

1995-09-15

1998-09-08

Williams, Hezron E.

Measuring and testing

Surface and cutting edge testing

Roughness

G01B 528

Patent

active

058047085

ABSTRACT:
An atomic force microscope comprises a vibrating device for producing transverse vibrations between a sample and a probe and a vertical load-adjusting device for adjusting the vertical load between the sample and the probe. The sample is vibrated transversely, thus inducing a deflecting vibration on a cantilever. The phase and the amplitude of this deflecting vibration are simultaneously measured. The dependence of the measured value on the vertical load between the sample and the probe is measured. Thus, the friction between the sample and the probe is analyzed.

REFERENCES:
patent: 5503010 (1996-04-01), Yamanaka
Hipp et al., "A Stand-Alone Scanning Force and Friction Microscope", Ultramicroscopy, 42-44, (1992), pp. 1498-1503.
Mate et al., "Atomic-Scale Friction of a Tungsten Tip on a Graphite Surface", Physical Review Letters, vol. 59, No. 17, 26 Oct. 1987, pp. 1942-1945.
Meyer et al., "Simultaneous Measurement of Lateral and Normal Forces with an Optical-Beam-Deflection Atomic Force Microscope", Appl. Phys. Lett., vol. 57, No. 20, 12 Nov. 1990, pp. 2089-2091.
Radmacher et al., "from Molecules to Cells: Imaging Soft Samples with the Atomic Force Microscope", Science, vol. 257, 25 Sep. 1992, pp. 1900-1905.
O'Shea et al., "Atomic Force Microscope Study of Boundary Layer Lubrication", Appl. Phys. Lett., vol. 61, No. 18, 02 Nov. 1992, pp. 2240-2242.
Burnham et al., "Force Microscopy", to be Published in Scanning Tunneling Microscopy: Theory and Appliction, p. 12.

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