Atomic force microscope

Details Atomic force microscope Atomic force microscope

2005-07-05

2005-07-05

Noland, Thomas P. (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

06912892

ABSTRACT:
An atomic force microscope for examining a sample is described. The atomic force microscope includes a probe assembly that includes a first tip and a second tip each directed towards a surface of a sample. The AFM further includes a source for applying a potential across the first tip and the second tip; at least one mechanism operable to cause relative motion between the surface and the probe; and at least one sensor operable to sense current flowing between the first tip and the second tip.

REFERENCES:
patent: 4935634 (1990-06-01), Hansma et al.
patent: 5025658 (1991-06-01), Elings et al.
patent: 5144833 (1992-09-01), Amer et al.
patent: 5449903 (1995-09-01), Arney et al.
patent: 5540958 (1996-07-01), Bothra et al.
patent: 5546374 (1996-08-01), Kuroda et al.
patent: 6196061 (2001-03-01), Adderton et al.
patent: 6211685 (2001-04-01), Stanford et al.
patent: 6366340 (2002-04-01), Ishibashi et al.
patent: 2002/0101573 (2002-08-01), Ishibashi et al.

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