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Scanning probe microscope incorporating an optical microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope incorporating an optical microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope system including removable probe senso

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope system including removable probe...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning probe microscope with improved probe head mount

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope with improved probe tip mount

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope, molecular processing method using the

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe system with spring probe

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning stylus atomic force microscope with cantilever tracking

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning stylus atomic force microscope with cantilever tracking

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning stylus atomic force microscope with cantilever tracking

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning stylus atomic force microscope with cantilever tracking

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning system having a deflectable probe tip

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning tip microwave near field microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning type near field interatomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning-probe microscope including non-optical means for detect

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Self-exciting and self-detecting probe and scanning probe...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Self-sensing tweezer devices and associated methods for...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Semiconductor probe and method of writing and reading...

Measuring and testing – Surface and cutting edge testing – Roughness
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Semiconductor probe with high resolution resistive tip and...

Measuring and testing – Surface and cutting edge testing – Roughness
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