Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1996-09-20
1998-10-13
Larkin, Daniel S.
Measuring and testing
Surface and cutting edge testing
Roughness
250306, 250307, H01J 3720, G01B 734
Patent
active
058214100
ABSTRACT:
A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This sharpened tip, which is electrically and mechanically connected to a central electrode, extends through and beyond an aperture in an endwall of a microwave resonating device such as a microwave cavity resonator or a microwave stripline resonator. Since the field intensity at the tip increases as the tip sharpens, the total energy which is radiated from the tip and absorbed by the sample increases as the tip sharpens. The result is improved spatial resolution without sacrificing sensitivity.
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Schultz Peter G.
Wei Tao
Xiang Xiao-Dong
Larkin Daniel S.
Martin Paul R.
Regents of the University of California
Taylor John P.
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