Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2000-02-18
2001-12-18
Williams, Hezron (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C250S306000
Reexamination Certificate
active
06330824
ABSTRACT:
FIELD OF THE INVENTION
The invention generally relates to methods of solution imaging and systems relating to the same.
BACKGROUND OF THE INVENTION
Atomic force microscopy (AFM) has proven to be a potentially valuable tool for studying biological systems. AFM imaging under solution allows one to potentially monitor biological processes m real time at a macromolecular level. A possible major problem with solution imaging occurs with samples, such as DNA, that are weakly absorbed to a surface, because they are easily displaced during imaging. This problem can be alleviated by resonance techniques that oscillate the cantilever as the sample is scanned laterally. There is a great need for reliable implementation of resonance mode imaging in solution because the most common techniques typically yield quality images infrequently.
SUMMARY OF THE INVENTION
In one aspect, the invention provides a method of imaging a sample present in a solution. The method comprises providing a microscope having a cantilever that is under the solution, contacting the cantilever with energy to cause the cantilever to bend and vibrate, and detecting the amplitude of vibration of the cantilever from the energy. The cantilever has at least one coating present thereon to absorb energy wherein the cantilever bends and vibrates.
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Erie Dorothy A.
Ratcliff Glenn
Superfine Richard
Cygan Michael
Myers Bigel & Sibley & Sajovec
The University of North Carolina at Chapel Hill
Williams Hezron
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