Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2006-10-03
2006-10-03
Raevis, Robert (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07114378
ABSTRACT:
Planar resonant tunneling sensor devices and methods for using the same are provided. The subject devices include first and second electrodes present on a surface of a planar substrate and separated from each other by a nanodimensioned gap. The devices also include a first member for holding a sample, and a second member for moving the first member and planar resonant tunneling electrode relative to each other. Also provided are methods of fabricating such a device and methods of using such a device for improved detection and characterization of a sample.
REFERENCES:
patent: 5795782 (1998-08-01), Church et al.
patent: 5932876 (1999-08-01), Niedermann
patent: 5982608 (1999-11-01), Kalnitsky et al.
patent: 6015714 (2000-01-01), Baldarelli et al.
patent: 6267872 (2001-07-01), Akeson et al.
patent: 6362002 (2002-03-01), Denison et al.
patent: 6464842 (2002-10-01), Golovchenko et al.
patent: 6474133 (2002-11-01), Okada
patent: 6627067 (2003-09-01), Branton et al.
patent: 6673615 (2004-01-01), Denison et al.
patent: 6674594 (2004-01-01), Wakabayashi et al.
patent: 6706203 (2004-03-01), Barth et al.
patent: 6706204 (2004-03-01), Roitman et al.
patent: 6783643 (2004-08-01), Golovchenko et al.
patent: 6843281 (2005-01-01), Barth et al.
patent: 6846702 (2005-01-01), Barth
patent: 2002/0130333 (2002-09-01), Watanabe et al.
patent: 2002/0132500 (2002-09-01), Watanabe et al.
patent: 2003/0044816 (2003-03-01), Denison et al.
patent: 2003/0066749 (2003-04-01), Golovchenko et al.
patent: 2003/0080042 (2003-05-01), Barth et al.
patent: 2003/0104428 (2003-06-01), Branton et al.
patent: 2004/0132070 (2004-07-01), Star et al.
patent: 2005/0014162 (2005-01-01), Barth et al.
patent: 2005/0017173 (2005-01-01), Kumar
patent: 2005/0022895 (2005-02-01), Barth et al.
patent: 2005/0069687 (2005-03-01), Barth
patent: 2005/0070042 (2005-03-01), Barth
patent: WO 00/34527 (2000-06-01), None
Bakkers et al. “Shell-Tunneling Spectroscopy of the Single-Particle Energy Levels of Insulating Quantum Dots,” (2001) Nano Letters, vol. 1(10):551-556.
Chang et al. “Resonant Tunneling in Semiconductor Double Barriers,” (1974) Applied Physics Letters, 24(12):593-595.
Goodhue et al. “Large Room-Temperature Effects from Resonant Tunneling Through AIAs Barriers,” (1986) Appl. Phys. Lett. 49(17):1086-1088.
Sollner et al. “Resonant Tunneling Through Quantum Wells at Frequencies Up to 2.5THz,” (1983) Appl. Phys. Lett. 43(6):588-590.
Esaki et al. “Superlattice and Negative Differential Conductivity In Semiductors,” (1970) IBM J. Res Development, 14:61-65.
Sollner et al. “Quantum Well Oscillators,” (1984) Appl. Phys. Lett. 45(12):1319-1321.
Barth Philip W.
Flory Curt
Pittaro Rick
Roitman Daniel
Stein Derek
Agilent Technologie,s Inc.
Raevis Robert
LandOfFree
Planar resonant tunneling sensor and method of fabricating... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Planar resonant tunneling sensor and method of fabricating..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Planar resonant tunneling sensor and method of fabricating... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3624375