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Scanning near-field optic/atomic-force microscope with observing

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe apparatus and drive stage therefor

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe device and processing method by scanning probe

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe devices and methods for fabricating same

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
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Scanning probe microscope

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