Scanning probe microscope

Details Scanning probe microscope Scanning probe microscope

2011-06-28

2011-06-28

Williams, Hezron (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

C116S275000, C850S030000, C850S055000, C850S039000, C850S040000, C850S041000

Reexamination Certificate

active

07966867

ABSTRACT:
The invention provides a scanning probe microscope capable of performing highly accurate three-dimensional profile measurement in a state in which no sliding of the probe or deformation of the sample substantially occurs. The present invention realizes a highly accurate three-dimensional profile measurement using a scanning probe microscope, in which the method performs measurement to obtain an accurate three-dimensional profile without causing damage to the sample by having the probe contact the sample at the measurement point and then move to a next measurement point, wherein the probe is pulled up and retracted temporarily and then moved to the next measurement point where it is approximated to the sample again, the method comprises analyzing the signals of the contact force sensor so as to obtain the height of the probe at the time when the probe contacts the sample with zero contact force, so as to substantially eliminate errors caused by sliding of the probe and deformation of the sample caused by minute contact force.

REFERENCES:
patent: 5714756 (1998-02-01), Park et al.
patent: 7350404 (2008-04-01), Kurenuma et al.
patent: 2001-33373 (2001-02-01), None
patent: 2004-132823 (2004-04-01), None

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