Scan data path coupling

Scan design with expanded access capability

Scan latch and test method therefore

Scan latch using half latches

Scan mechanism for monitoring the state of internal signals of a

Scan operation executing system

Scan path circuit

Scan path circuit for testing multi-phase clocks from sequential

Scan path circuit with clock signal feedback, for skew avoidance

Scan path circuitry including a programmable delay circuit

Scan path diagnostic method

Scan path forming circuit

Scan path system and an integrated circuit device using the same

Scan register and testing circuit using the same

Scan register with decoupled scan routing

Scan test

Scan test apparatus

Scan test apparatus for digital systems having dynamic random ac

Scan test circuit and semiconductor integrated circuit device wi

Scan test circuit for use in semiconductor integrated circuit