1990-05-14
1993-02-09
Beausoliel, Robert W.
Excavating
371 221, 371 151, H04B 1700
Patent
active
051857456
ABSTRACT:
A method of diagnosing memory and CPU boards by using scan rings which are composed of interconnected shift registers. A maintenance processor (MP) down-loads vector files to the scan rings. The scan rings are transparently partitioned into subsections and each subsection and individual bits are then tagged using a high level language, i.e., a scan path diagnostic language (SPDL). The user of SPDL writes a program in SPDL language addressing a portion of the scan ring. Next, the high level commands are translated into low level machine code and run on the MP. Bits are then loaded into the scan ring and subjected to a test routine. Additional commands are given to correct any errors uncovered and the bits are then reloaded through the MP to the hardware element being tested.
REFERENCES:
patent: 4268902 (1981-05-01), Berglund et al.
patent: 4503537 (1985-03-01), McAnney
patent: 4513418 (1985-04-01), Bardell, Jr. et al.
patent: 4534028 (1985-08-01), Trischler
patent: 4698588 (1987-10-01), Hwang et al.
patent: 4788683 (1988-11-01), Hester et al.
patent: 4794599 (1988-12-01), Purcell et al.
patent: 4947357 (1990-08-01), Stewart et al
patent: 4947395 (1990-08-01), Bullinger et al.
patent: 4980889 (1990-12-01), DeGuise et al.
patent: 5001713 (1991-03-01), Whetsel
Reilly, John et al., "Processor Controller For IBM 3081," IBM J. Res. Develop., vol. 26, No. 1, Jan. 1982.
Monachino, Michael, "Design Verification System For Large Scale LSI Designs, " IBM J. Res. Develop., vol. 26, No. 1, Jan. 1982.
Beausoliel Robert W.
Hua Ly V.
Prime Computer Inc.
LandOfFree
Scan path diagnostic method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scan path diagnostic method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scan path diagnostic method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-329268