1995-08-24
1998-02-17
Nguyen, Hoa T.
Excavating
G01R 3178
Patent
active
057198772
ABSTRACT:
A method of testing the performance of a combinational logic circuit is described. In contrast to a structural test which verifies the operation of the combinational logic circuitry, a performance test allows the performance of a combinational logic circuit to be tested by determining the accuracy of a set of outputs resulting from a change in input bits to the combinational logic circuit. Thus, it is possible to monitor more closely performance aspects, such as the maximum delay from input to output of a combination logic circuit.
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Morris James H.
Nguyen Hoa T.
SGS-Thomson Microelectronics Limited
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