Scan design with expanded access capability

Details Scan design with expanded access capability Scan design with expanded access capability

1993-11-19

1997-08-12

Beausoliel, Jr., Robert W.

Excavating

371 225, 324 731, G01R 3128

Patent

active

056573286

ABSTRACT:
A serial scan design permits shift element (71) to selectively access more than one node (43) of a target circuit (14).

REFERENCES:
patent: 4872169 (1989-10-01), Whetsel
patent: 5056093 (1991-10-01), Whetsel
patent: 5132974 (1992-07-01), Rosales
patent: 5157627 (1992-10-01), Gheewala
patent: 5179534 (1993-01-01), Pierce et al.
Colin M. Maunder and Rodham E. Tulloss, "The Test Access Port and Boundary-Scan Architecture", IEEE Computer Society Press Tutorial, Chapter 13. Single Transport Chain, pp. 151-157, 1990.

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