Scan test apparatus

Details Scan test apparatus Scan test apparatus

1996-12-02

1999-04-06

Beausoliel, Jr., Robert W.

Excavating

39518306, G01R 3128

Patent

active

058927794

ABSTRACT:
A scan test apparatus for operating a test unit according to a test pattern and outputs address information of the test pattern at which a fail takes place, which includes a memory unit for holding circuit information in which scan flip-flops are written at corresponding addresses and a control unit for outputting, in addition to the address information, a scan flip-flop name from the memory unit corresponding to the address information.

REFERENCES:
patent: 5303246 (1994-04-01), Anderson et al.
patent: 5513188 (1996-04-01), Parker et al.
patent: 5544173 (1996-08-01), Meltzer
patent: 5544308 (1996-08-01), Giordano et al.
patent: 5550841 (1996-08-01), O'Brien
patent: 5630048 (1997-05-01), La Joie et al.
patent: 5663967 (1997-09-01), Lindberg et al.
patent: 5691991 (1997-11-01), Kessler et al.

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