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Testing system for a device under test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing system for circuit board self-test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing system for evaluating integrated circuits, a burn-in tes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing system for evaluating integrated circuits, a burn-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing system for evaluating integrated circuits, a burn-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing system for evaluating integrated circuits, a testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing system for evaluating integrated circuits, a testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing system for semiconductor memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Testing system, testing system control method, and test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing the interrupt sources of a microprocessor

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Testing the operation of integrated circuits by simulating a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing the sharing of stored computer information

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent

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Testing unit with testing information divided into redundancy-fr

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Testing using independently controllable voltage islands

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Testing using test packets containing random data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Testing with high speed pulse generator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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TF-determination apparatus, and TF-determination method as...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Thermal monitoring and response apparatus and method for...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Third-party voting to select a master processor within a...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Thread interception and analysis

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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