Testing with high speed pulse generator

Details Testing with high speed pulse generator Testing with high speed pulse generator

2007-05-08

2007-05-08

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S707000, C714S744000, C714S701000, C713S400000, C713S500000, C713S503000, C327S047000, C327S116000

Reexamination Certificate

active

11184621

ABSTRACT:
An integrated circuit, where a hard macro is resident within the integrated circuit. The hard macro receives a clock signal at a frequency that is below the operational frequency of the integrated circuit, and produces a clock signal having a frequency that is at least equal to the operational frequency of the integrated circuit. The hard macro has a first input that receives a first signal from the tester. A second input receives a second signal from the tester, offset by substantially ninety degrees from the phase of the first signal. A speed select input receives a signal, where the signal is selectively set at one of a logical high indicating a first multiplier to be applied in the hard macro, and a logical low indicating a second multiplier to be applied in the hard macro. A clock multiplication circuit receives the first signal, selectively receives the second signal, and receives the speed select signal, and produces the clock signal. The clock signal is a multiple of the tester frequency that is dependent at least in part upon the setting of the speed select signal and the tester frequency. An input receives the clock signal from the hard macro and provides the clock signal to the integrated circuit during testing.

REFERENCES:
patent: 6396323 (2002-05-01), Mizuno
patent: 2004/0062135 (2004-04-01), Itakura
patent: 2004/0268193 (2004-12-01), Nishida et al.

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