Testing using independently controllable voltage islands

Details Testing using independently controllable voltage islands Testing using independently controllable voltage islands

2003-02-20

2008-09-23

Tran, Minh-Loan T (Department: 2826)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C716S030000

Reexamination Certificate

active

07428675

ABSTRACT:
A voltage island architecture wherein the source voltage of each voltage island can be independently turned on/off or adjusted during a scan-based test. The architecture includes a plurality of voltage islands (102, 104), each powered by a respective island source voltage (VDDI1, VDDI2), and a testing circuit (116), coupled to the voltage islands, and powered by a global source voltage (Vg) that is always on during test, wherein each island source voltage may be independently controlled (106, 108) during test.

REFERENCES:
patent: 6664798 (2003-12-01), De Jong et al.
patent: 2002/0149263 (2002-10-01), Blanco et al.
patent: 480564 (2002-03-01), None
patent: 494632 (2002-07-01), None

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