LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery

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Semiconductor test system supporting multiple virtual logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing apparatus and method for optimizing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique

Reexamination Certificate

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Semiconductor testing apparatus and method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing apparatus and method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing apparatus for testing semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing apparatus for testing semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing circuit, semiconductor storage device,...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor testing equipment, testing method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor wiring substrate, semiconductor device, method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Sensor apparatus and monitoring method of control system...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Sensor fault detection, isolation and accommodation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Separable cyclic redundancy check

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Separately controlled scan paths of functional registers...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Separately storing core boot data and cluster configuration...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Separation of debug windows by IDS bit

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Sequence error event detection and correction using fixed block

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Patent

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Sequence estimating

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Sequence-based verification method and system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Sequential coordination of test execution and dynamic data

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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