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Circuit testing with ring-connected test instrument modules

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit testing with ring-connected test instrument modules

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit timing monitor having a selectable-path ring oscillator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit to measure skew

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
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Circuit to prevent inadvertent test mode entry

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit to reduce rail noise voltage spikes due to switching...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Circuit with expected data memory coupled to serial input lead

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuit, architecture and method for analyzing the operation...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Circuit, semiconductor device and method for enhancing test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Circuit, system and method for arranging data output by...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Circuit, system and method for arranging data output by...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Circuit-trending system and method

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Circuitry for and system and substrate with circuitry for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuitry for handling high impedance busses in a scan...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuitry to prevent peak power problems during scan shift

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuitry with multiplexed dedicated and shared scan path cells

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuitry, apparatus and method for embedding a test status...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Circuits and associated methods for improved debug and test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Circuits and methods for debugging an embedded processor and...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Circuits and methods for measuring signal propagation delays...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
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