Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate
2005-06-14
2008-09-09
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Skew detection correction
Reexamination Certificate
active
07424650
ABSTRACT:
A method and test circuits for measuring skew between two circuit blocks of an integrated circuit. A first data signal is propagated through a first circuit block and a first clock signal is propagated through a second circuit block. The first data signal is latched synchronized to the first clock signal after propagating the first data and clock signals. The first data signal is time shifted relative to the first clock signal until the first data signal is no longer validly latching. A second data signal is propagated through the second circuit block and a second clock signal is propagated through the first circuit block. An inversion of the second data signal synchronized to an inversion of the second clock signal is latched. Then, the second data signal is time shifted relative to the second clock signal until the inversion of the second data signal is no longer validly latching.
REFERENCES:
patent: 5047710 (1991-09-01), Mahoney
patent: 5463655 (1995-10-01), Llewellyn
patent: 5579352 (1996-11-01), Llewellyn
patent: 5740210 (1998-04-01), Rokugawa
patent: 6850051 (2005-02-01), Roberts et al.
patent: 6946640 (2005-09-01), Kawamura
Palathol Mana Sivadasan Mohandas
Rohilla Gajender
Britt Cynthia
Cypress Semiconductor Corporation
Radosevich Steven D
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